Subpixel Corner Detection for Tracking Applications using CMOS Camera Technology
Christoph Stock, Ulrich Mühlmann, Manmohan Krishna Chandraker, Axel J. Pinz · 2002
A multistage approach to gray-level corner detection is proposed in this paper, which is based on fast corner extraction using the Plessey corner detector combined with CMOS image acquisition technologies and localization refinement using a spatial subpixel analysis approach. The proposed corner detector detects corners as the intersection points of the involved edges, only by using a small neighborhood of the estimated corner position. With this approach it is also possible to compute the corner orientation and the dihedral angle of the corner. In comparison to the standard Plessey detector, which can show localization errors of several pixels, experimental results show an average error of only 0.36 pixels for our algorithm. 1.