Modeling Test Escape Rate as a Function of Multiple Coverages
Kenneth M. Butler, John M. Carulli, J. Saxena · 2008
The Williams and Brown model has long been the gold standard for estimating test escape rate as a function of yield and fault coverage. However, today's test programs have a number of differing test types, often with overlapping failing unit detections. This paper details the development of a method which permits test escape rate predictions based on product yield and multiple overlapping test coverages.