Sequential faults and aliasing
Slawomir Pilarski, Tsunehiko Kameda, A. Ivanov · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 1993
Aliasing is studied for delay and stuck-open faults. It is shown that, as the test sequence length is increased, the probability of aliasing for such faults tend to 2/sup -k/, where k is the number of binary memory elements in a linear compactor. The result is based on the assumption that the linear compactor has an irreducible characteristic polynomial. Some recent results on combinational faults are special cases of the results presented here.>