A Scalable built-in self-test/self-diagnosis architecture for 2D-mesh based chip multiprocessor systems
Shu-Yen Lin, Chan-Cheng Hsu, An-Yeu Andy Wu · 2009
In this paper, we proposed a scalable built-in self-test/self-diagnosis architecture, surrounding test ring (STR), to detect and locate faulty FIFOs and faulty MUXs for 2D-mesh based CMP systems. Proposed STR supports 97.79% fault coverage in FIFOs and MUXs and tests with 388 ~ 2886 test cycles in different testing methods and mesh sizes.