A programmable cellular automata structure for built-in self-test
D.R. Chowdhury, Indranil Sengupta, P.P. Chaudhuri · 2005
The regular structure of 1-D and 2-D cellular automata as a Built-in Self-Test (BIST) structure have been proposed [Hort'89, Hort'90, Das'89, Das90b, DRC91b]. In the present paper, the performance of 2-D CA as a pseudo-randorn pattern generator has been evaluated. The potential increase in the local neigh bourhood structure for 2-D CA has led to better randomness of the generated patterns as compared to LFSR and 1-D CA. The quality of the random patterns generated with 2-D CA based BIST structure has been evaluated by comparing the fault cover age on several benchmark circuits. The design of a Programmable Cellular Automata chip has been proposed as a versatile BIST structure.