I/sub DDQ/ TESTING IN CMOS DIGITAL ASIC'S - PUTTING IT ALL TOGETHER
Roger Perry · 2005
IDDQ testing was implemented to reduce line fallout after 99.6% stuck-at-fault testing failed to achieve desired quality goals. This paper shows the effects of three years of IDDQ testing on line fallout and provides details on a proven IDDQ test flow. The paper includes examples of limit calculations, defects found, and recommendations for putting an IDDQ test together.