Diagnosis with Limited Failure Information
Yu Huang, Wu-Tung Cheng, Nagesh Tamarapalli, Janusz Rajski, Randy Klingenberg, Will Hsu, Yuan-Shih Chen · Proceedings/Proceedings - International Test Conference · 2006
This paper discusses the challenges associated with diagnosing chain integrity and system logic failures in the production test environment with limited failure information. The following three methods were proposed to enhance diagnosis resolution in this scenario: (1) static pattern re-ordering (2) dynamic pattern re-ordering (3) per-pin based diagnosis. Experimental results illustrate that per-pin based failure logging and diagnosis algorithms enable scan chain diagnosis in volume production environment. Successful application of per-pin based chain diagnosis is demonstrated with an industrial case