Fault distinguishing pattern generation
Thomas Bartenstein · 2002
Test Generation for VLSI circuits suffers from two competing goals-to reduce the cost of test by minimizing the number of tests, and to be able to diagnose errors when failures occur. This paper outlines a methodology for generating diagnostic test patterns as they are needed using standard ATPG took. These diagnostic patterns are guaranteed to provide better diagnostic resolution than traditional manufacturing test patterns, and the use of standard ATPG fools enables generation of diagnostic patterns only when these patterns are needed.