Minimizing the Lengths of Test Sequences with Overlapping
Fan Zhang, Robert L. Probert · 2006
In finite-state machine (FSM) based testing, it is highly desirable to minimize the test sequence length while achieving a certain level of fault coverage. This article, assuming the presence of a unique input/output (UIO) sequence for each state, proposes a novel mathematical model to construct a minimum-length test sequence that makes use of overlapping. It also describes algorithms for generating such test sequences, especially, efficient algorithms for FSM with special features. Examples are provided to illustrate the model and results