Robust detection and ordering of ellipses on a calibration pattern
Luis Álvarez, Agustín Salgado, Javier Sánchez · Pattern Recognition and Image Analysis · 2007
The aim of this work is to accurately estimate from an image the parameters of some ellipses and their relative positions with respect to a given pattern. The process is characterized because it is fully automated and is robust against image noise and occlusions. We have built a calibrator pattern with two planes each containing several ordered circles in known 3D positions. Our method is able to estimate the position of every ellipse and to put them into correspondence with the original calibrator circles.