Overdrive in the Ramp Histogram Test of ADCs
Francisco Alegría, António Cruz Serra · IEEE Transactions on Instrumentation and Measurement · 2005
This paper presents a study about the amount of overdrive to use when analog-to-digital converters (ADCs) are tested with the ramp histogram method. Overdrive is used to limit the error induced by input-equivalent noise in the estimation of the ADC transition voltages. This study has direct application in the new coarse ramp static test.