BIST-based delay-fault testing in FPGAs
M. Abramovici, Charles E. Stroud · 2003
We present the first delay-fault testing approach for FPGAs, applicable both for manufacturing and for on-line testing. Our approach is based on BIST, is comprehensive, and does not require expensive ATE. We have successfully implemented this BIST approach on the ORCA 2C series FPGA.