An Open Modular Test Concept for the DSP KISS-16V2
J. Preibner, G.H. Huamann-Bollo, G. Mahlich, Johannes Schuck, Hans Sahm, P. Weingart, D. Weinsziehr, J. Yea · 2005
This paper describes the modular test concept of the digital signal processor @SP) KISS-16V2 incorporating scan test, extensive use of BIST methods and boundary scan test, embedded in a JTAG environment to achieve an optimal fault coverage to cost ratio.