An inexpensive method of detecting localised parametric defects in static RAM
Yvon Savaria, Claude Thibeault · 2002
The author presents an effective method of testing spot defects causing delay faults in SRAM circuits, without having to perform a full speed test of every single cell in a chip. The method is based on the detection of spot defects through the imbalance they cause to memory cells by transforming the imbalance effect into a permanent error. Such tests may be performed at a low speed, while retaining an excellent ability to detect non-catastrophic spot defects.>