Layout-Aware Scan Chain Reorder for Skewed-Load Transition Test Coverage
Sying-Jyan Wang, Kuo-lin Peng, Katherine Li · Asian Test Symposium · 2006
In this paper, we propose a layout-based scan chain ordering method to improve fault coverage for skewedload delay test with minimum routing overhead. This approach provides many advantages over previous methods. (1) The proposed method can provide 100% test pair coverage for all detectable transition faults. (2) With layout information taken into account, the routing penalty is small, and thus the impact on circuit performance will not be significant.