Boolean equations for multiple paths sensitisationof digital oscillation built-in self test
Christian Dufaza, Hassan Ihs, Bożena Kamińska · Electronics Letters · 1998
A major improvement to the digital oscillation built-in self test (DOBIST) method is proposed. The DOBIST technique deals with simultaneously testing path delay, gate delay and stuck-at faults in digital integrated circuits. The equations reported allow concurrent multiple oscillations and greatly improve the DOBIST test quality.