Built-in current mode circuits for I/sub ddq/ monitoring
B.D. Brown, Robert D. McLeod · 2002
A novel circuit for I/sub ddq/ monitoring is presented. The circuit is based on current mode signaling and is intended for use in a built-in test mode. A test chip has been fabricated in 1.2 micron CMOS. Preliminary simulation result are very promising and demonstrate that the basic technique may be quite practical.