Calculating the effects of linear dependencies in m-sequences used as test stimuli
Paul H. Bardell · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 1992
When pseudorandom patterns generated by a linear feedback shift register (LFSR) are used as test stimuli, there is always a concern about the linear dependencies within the sequence of patterns. It is possible for these linear dependencies to preclude a specific test pattern from being present in the sequence of applied patterns. These dependencies and ways to calculate their effects on a particular test are discussed, with the goal of developing the means of analyzing a digital circuit which is connected to a source of pseudorandom patterns to determine whether or not linear dependencies are encountered by a particular connection.>