Combinational and sequential circuit fault diagnosis using AI techniques
B. Rogel-Favila, Peter Y. K. Cheung · 2003
The authors describe an algorithm for the location of faults in digital circuits. It is based on the 'deep reasoning' approach to circuit fault diagnosis, and since a failure is defined as a mismatch between expected and measured behavior, it can deal with a wider range of different types of faults than traditional approaches. The application of the diagnosis procedure to examples of combinational and sequential circuits gives encouraging results.>