Lessons from at-speed scan deployment on an Intel® Itanium® microprocessor
P. Pant, Joshua Zelman, Glenn Colon-Bonet, Jennifer L. Flint, Steve Yurash · 2010
Lessons learnt during the deployment of transition scan content on an Intel®Itanium®server microprocessor design and its use for electrical debug and defect screening in high-volume manufacturing are described. While many publications in the area of transition scan show it being practiced as an efficient defect screening tool, only a minority of these designs were high-performance microprocessor designs. This work illustrates the benefits of such techniques on complex microprocessors.