Algorithms for State Restoration and Trace-Signal Selection for Data Acquisition in Silicon Debug
Ho Fai Ko, Nicola Nicolici · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 2009
To locate and correct design errors that escape pre-silicon verification, silicon debug has become a necessary step in the implementation flow of digital integrated circuits. Embedded logic analysis, which employs on-chip storage units to acquire data in real time from the internal signals of the circuit-under-debug, has emerged as a powerful technique for improving observability during in-system debug. However, as the amount of data that can be acquired is limited by the on-chip storage capacity, the decision on which signals to sample is essential when it is not knownaprioriwhere the bugs will occur. In this paper, we present accelerated algorithms for restoring circuit state elements from the traces collected during a debug session, by exploiting bitwise parallelism. We also introduce new metrics that guide the automated selection of trace signals, which can enhance the real-time observability during in-system debug.