Transition Tests for High Performance Microprocessors
Yi-Shing Chang, S. Chakravarty, Hiep Hoang, N. Thorpe, Khen Wee · 2005
The scope and need for scan based transition tests in the context of high volume manufacturing testing of microprocessors is discussed. A classification of transition faults for latch based design is presented. Finally, we discuss a silicon experiment to understand the most fundamental issue of scan based transition testing viz. their robustness.