Research on Reliability Improvement of NAND Flash Memory in FAT File System
Juntao Zhang, Kun Yao · 2010
NAND Flash memory is widely used in embedded products because of its large capacity and high access speed. But the reliability of NAND flash memory should be improved because of its bad blocks. Two methods for reliability improvement of NAND flash memory in FAT file system are introduced in this article, by using non-fixed storage FAT table and automatically looking-for and replacing bad blocks algorithm. These methods will shield bad blocks completely at the expense of lower write speed and have been proved efficient in embedded applications.