March PS(23N) test for DRAM pattern-sensitive faults
Vyacheslav N. Yarmolik, Yu.V. Klimets, Serge N. Demidenko · 2002
March algorithms are widely used in DRAM testing. They are relatively simple yet providing high fault coverage especially with respect to stuck-at faults, address uniqueness faults, and some types of cell-interaction faults. At the same time the capability of traditional March tests to detect pattern-sensitive faults is rather limited. This paper proposes an approach to enhance March test detection capability with respect to the pattern-sensitive faults.