Efficient multisine testing of analog circuits
Naveena Nagi, Abhijit Chatterjee, Ashok Balivada, Jacob A. Abraham · 2002
An efficient method has been developed for generating test waveforms for linear analog circuits which minimize the test effort and maximize the test confidence. The method makes use of a fault-based automatic test pattern generator (ATPG) to generate a set of test frequencies. A successive gradient method is used to combine these individual sinusoidal signals in a way that maximizes the fault coverage. The compressed waveform can be stored on-chip and used for built-in test of analog circuits.