Evaluation of i/sub DD//v/sub OUT/ cross-correlation for mixed current-voltage testing of analogue and mixed-signal circuits
José Machado da Silva, J.S. Matos · European Design and Test Conference · 1996
The use of cross-correlation between power supply current and output voltage dynamic responses is presented as a methodology for improved mixed current/voltage testing of analogue and mixed-signal circuits. Results obtained from simulations are presented which show that better fault coverage and a simplification of test circuitry can be obtained, when compared with the results obtained from the direct observation of the individual signals. These advantages are important factors to develop viable new design for testability and built-in self test techniques.