Basic boundary-scan for in-circuit test
Alan Albee, M.T. Ellis, G.D. Robinson · 2002
Boundary-scan was developed to allow testing without a full bed-of-nails, but many boards have only a few boundary-scan parts, and still require a full bed-of-nails. The manufacturers of those boards are getting many advantages from the use of boundary-scan, including faster model development time for complex parts, faster test run times, faster model and board debug times and much more accurate diagnosis than a conventional in-circuit test provides. This paper describes a tool that provides these benefits without needing any change to the main in-circuit test system.>