Online testing approach for very deep-submicron ICs
Michele Favalli, Cecilia Metra · IEEE Design & Test of Computers · 2002
Very deep-submicron technologies pose new challenges to IC testing. In particular, crosstalk and transient faults are difficult to detect with traditional methods. Online testing techniques can detect these faults, however, and a new approach extends these techniques to include gross-delay faults. Moreover, this approach described by the authors can be exploited to detect stuck-at and bridging faults offline.