Extending OPMISR beyond 10× scan test efficiency
C.F. Barnhart, V. Brunkhorst, F. Distler, O. Farnsworth, Alexander Ferko, Brion Keller, D. Scott, Bernd Koenemann, Tetsuo Onodera · IEEE Design & Test of Computers · 2002
Rapidly increasing ASIC gate counts are stressing the test capacity of manufacturing test equipment. New on-product multiple-input signature register (OPMISR) techniques compress test vectors produced by ATPG, substantially reducing data volume and test time.