Automatic memory failure analysis using an expert system in conjunction with a memory tester/analyzer
Tohru Tsujide, Hiroyuki HAMADA, David Y. Lepejian, J. M. Caywood · 1993
A methodology by which predictions of memory failure are made prior to manufacturing is presented. Based on these predictions and supporting historical data, expert rules are automatically created and used in conjunction with a memory tester/analyzer to determine the underlying physical causes of particular memory device failures. The histogram of the failure causes for a given lot can be plotted and evaluated. Examples of the application of this methodology to the manufacture of 4-Mb DRAMs are given.>