A Simulator of Small-Delay Faults Caused by Resistive-Open Defects
Alejandro Czutro, Nicolas Houarche, Piet Engelke, Ilia Polian, Mariane Comte, M. Renovell, Bernd Becker · 2008
We present a simulator which determines the coverage of small-delay faults, i.e., delay faults with a size below one clock cycle, caused by resistive-open defects. These defects are likely to escape detection by stuck-at or transition fault patterns. For the first time, we couple the calculation of the critical size of a small-delay fault with the computation of the resistance range of the corresponding resistive-open defect for which this size is exceeded. By doing so, we are able to extend probabilistic fault coverage metrics initially developed for static resistive bridging faults to small-delay defects.