A design for testability technique for test pattern generation with LFSRs
Dimitri Kagaris, Spyros Tragoudas · 2002
Test sets for built-in self-test (BIST) test pattern generation (TPG) are normally pseudorandom or truncated pseudoexhaustive. In this work, the authors propose a pseudorandom TPG scheme which is based on the idea of ordering appropriately the cells of a linear feedback shift register (LFSR) in order to control the percentage of linear dependencies in the generated patterns. The LFSR cell ordering is done prior to the circuit's layout phase, in accordance with the design for testability principles. The proposed pseudorandom scheme compares favorably with the use of truncated pseudoexhaustive test sets with or without cell reordering.>