Practical built-in test of CMOS state machines with realistic faults
Mehdi Katoozi, Mani Soma · 2003
A design-for-test scheme is presented that is capable of testing programmable and register logic arrays with the same low-cost test hardware. This scheme detects real faults resulting from mask defects in the circuit, is practical to implement, and can be adopted as a built-in-test system using readily available modules in application-specific integrated circuits.>