A sophisticated memory test engine for LCD display drivers
Oliver Spang, Hans Martin von Staudt, Michael G. Wahl · 2007
Economic testing of small devices like LCD drivers is a real challenge. In this paper we describe an ap-proach where a production tester is extended by a memory test engine (MTE). This MTE, which consists of hardware and software components allows testing the LCD driver memory at speed, allowing at the same time the concurrent execution of other tests. It is fully integrated into the tester. The MTE leads to a signifi-cant increase of memory test quality and at the same time to a significant reduction of the test time. The test time reduction that was achieved by executing the memory test in parallel to other analog tests lead to the test cost reduction, which was the impetus for devel-oping the MTE. 1