On compact test sets for multiple stuck-at faults for large circuits
Seiji Kajihara, Akira Murakami, Takenori Kaneko · 2003
This paper investigates test sets with high fault coverage for multiple stuck-at faults of large combinational circuits and fully scanned sequential circuits. We show the ability of multiple fault detection of test sets generated for single stuck-at-faults, then give a procedure for generating a compact test set with high multiple fault coverage. Results show that our method can generate a test set with complete fault coverage for many circuits, and the size of the test set is smaller than previously reported ones.