Tests for resistive and capacitive defects in address decoders
M. Klaus, A.J. van de Goor · 2002
Presents a complete analysis, at the electrical level, of address decoder faults caused by resistive opens, and by capacitive-coupling between address lines. Several authors have demonstrated the importance of this class of faults. New test conditions, and new march tests are derived to detect the resulting faults; and industrial results, applied to DRAMS, show the effectiveness of the new tests.