Low Power Oriented Test Modification and Compression Techniques for Scan Based Core Testing
T. Hayashi, N. Ikeda, Tsuyoshi Shinogi, Hisabumi Takase, Hajime Kita · Asian Test Symposium · 2006
This paper proposes effective techniques for reducing not only test data volume but also scan-in transitions that are closely related to power dissipation. First, a new test smoothing algorithm was adopted that can reduce scan-in transitions through test vector modification. Second, a test compression method was proposed that can reduce test data volume while keeping down the increase of transitions as small as possible. The effectiveness of the proposed techniques was shown through experiments for ISCAS'89 benchmark circuits