SoC yield optimization via an embedded-memory test and repair infrastructure
Samvel K. Shoukourian, Valery A. Vardanian, Y. Zorian · IEEE Design & Test of Computers · 2004
Today, embedded memories are the most important contributor to SoC yield. To maximize embedded-memory yield, advanced test and repair solutions must be an integral part of the memory block. We analyze factors that affect memory yield and presents advanced techniques for maximizing the positive impact.