A bridge for measuring the a.c. parameters of junction transistors
A.R. Boothroyd, J. Almond · Proceedings of the IEE - Part III Radio and Communication Engineering · 1954
A bridge is described for measuring the low-frequency parameters of junction transistors under emitter open-circuit and collector shortcircuit conditions. Principal features of the bridge are its circuit simplicity and ease of operation. The transistor parameters are measured to an accuracy better than ±4%.