Achieving Zero-Defects for Automotive Applications
Rajesh Raina · 2008
This paper describes a comprehensive flow for achieving Zero Defect semiconductor chips in a costeffective manner. The focus is on Designed-In Quality achieved through harmonious deployment of defect prevention and defect detection methods during the chip design phase (i.e., through DFM and DFT). The paper also identifies opportunities for improving the Zero- Defect design flow.