Detecting and diagnosing open defects
Dat Tran, LeRoy Winemberg, Darrell Carder, Xijiang Lin, Joe LeBritton, Bruce Swanson · 2010
One of the common failures found in manufactured ICs are interconnect opens. While stuck-at and transition fault automatic test pattern generation (ATPG) patterns can detect open defects, these fault models do not catch all of them. This poster describes a project and research with a new open fault model to supplement the others. The project consists of many parts that target specific types of known open defects.