Remote Control for Microscopy Applications
Francesca Mighela, Cristian Perra · Conference proceedings - IEEE Instrumentation/Measurement Technology Conference · 2006
The first remote instruments have been used during the World War I. Starting from this moment an increasing number of instruments has become remote controlled. Despite the many announcements, real Remote Control has not been achieved for a vast class of instruments. The paper proposes an application to remote control a Scanning Electron Microscope.