A pragmatic test and diagnosis methodology for partially testable MCMs
Marcelo Soares Lubaszewski, Meryem Marzouki, Mohamed Hédi Touati · 2002
Current MCM market cannot afford yet 100% product testability. This paper presents a way to get along with partial testability. Under the assumption that module-level boundary scan is available and that, at the chip-level, it is only implemented in some of the dies, we propose a methodology for simultaneous test and diagnosis of boundary scan and non boundary scan parts.>