Replacing Error Vector Magnitude Test with RF and Analog BISTs
Dallas Webster, Rick D. Hudgens, Donald Y.C. Lie · IEEE Design & Test of Computers · 2011
RF and analog BIST techniques are capable of replacing the traditional error vector magnitude (EVM) test used in production. In a case study, four BISTs detected actual production faults in a commercial, highly integrated WLAN device. In combination with traditional digital testing, the BISTs caught an impressive 100% of EVM failures during production of over a million devices, which presents significant opportunities for both cost and time savings.