A complete scheme of built-in self-tests (BIST) structure for fault diagnosis in analog circuits and systems
Alkis A. Hatzopoulos, Stylianos Siskos, J.M. Kontoleon · IEEE Transactions on Instrumentation and Measurement · 1993
The implementation of BIST in analog circuits is investigated, and a complete BIST scheme is proposed. This scheme can be included in any analog or mixed analog-digital circuit and can check its responses by following selected testing procedures. A CMOS chip supporting the proposed BIST structure is designed to facilitate the application of the scheme in a variety of analog circuits. Results from the application of the BIST scheme on active circuits are given, showing its effectiveness and its convenience.>