A novel concurrent fault simulation method for mixed-signal circuits
Junwei Hou, William H. Kao, A. Chatterjee · 2003
Fault simulation is critical in test development and fault diagnosis for mixed-signal systems. In this paper we present a novel concurrent fault simulation method for analog/digital mixed-signal circuits. A prototype mixed-signal fault simulation system is developed based on two existing digital and analog fault simulators. The key issue of fault list propagation between digital and analog fault simulators is addressed. Our fault simulation method can deal with mixed-signal systems containing asynchronous digital circuits, nonlinear analog devices, and systems with digital/ analog feedback loops. Simulation results for a PLL circuit domesticate the efficiency of this concurrent mixed-signal fault simulation system.