Code-width testing-based compact ADC BIST circuit
D. Lee, Kwisung Yoo, K. Kim, G. Han, Sung Jin Kang · IEEE Transactions on Circuits & Systems II Express Briefs · 2004
This paper proposes a new analog-to-digital converter (ADC) built-in self-test (BIST) scheme based on code-width and sample-difference testing that does not require a slope-calibrated ramp signal. The proposed BIST scheme can be implemented by a simple digital circuit whose gate count is only approximately 550. The proposed BIST scheme is verified by simulation with 138 test circuits of 6-b pipeline ADC with arbitrary faults. Simulation results show that it effectively detects not only the catastrophic faults but also some parametric faults. The simulated fault coverage is approximately 99%.