Theorems for identifying undetectable faults in partial-scan circuits
Irith Pomeranz, Sudhakar M. Reddy · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 2003
We provide a definition of undetectable faults in partial-scan circuits under a test application scheme where a test consists of primary input vectors applied at-speed between scan operations. We also provide sufficient conditions for a fault to be undetectable under this test application scheme. We present experimental results on finite-state machine benchmarks to demonstrate the effectiveness of these conditions in identifying undetectable faults.