March Test Generation Revealed
Alfredo Benso, Alberto Bosio, Stefano Di Carlo, Giorgio Di Natale, P. Prinetto · IEEE Transactions on Computers · 2008
Memory testing commonly faces two issues: the characterization of detailed and realistic fault models, and the definition of time-efficient test algorithms to detect them. March tests have proven to be a fast, simple and regularly structured class of memory test algorithms. This paper proposes a new polynomial algorithm to automatically generate march tests. The formal model adopted to represent memory faults allows the definition of a general methodology to deal with both static, dynamic and linked faults.