Multi Background Memory Testing
S. V. Yarmolik, Ireneusz Mrozek · 2007
It is widely known that the Pattern sensitive faults are the most difficult to detect during RAM's testing process. One of the technique which can be used to effective detection of this kind of faults is multi-background test technique. According to this technique multiple run memory test execution is done. In this case to achieve high fault coverage the structure of the consecutive memory backgrounds are very important. This paper defines requirements which have to be taken into account in the background selection process. Set of backgrounds which satisfied those requirements guarantee us to achieve very high fault coverage for multi-background memory testing.